Information Depth

Calculate the Information Depth for Your XRF Analysis

Use this calculator to determine the information depths of trace and minor elements in a given matrix for a specific excitation configuration.

This online calculator computes the information depth for K-alpha and L-alpha lines of all elements from Carbon or Calcium, respectively to Uranium in a given matrix (main composition of the sample) and for a given spectrometer configuration.

Absorbers in the excitation channel, like the air path or primary filters, and the amount of fluorescence that has to come from the information depth can also be specified.

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Spectrometer

kV

° (DEG)
° (DEG)

mBar
cm

Excitation filters

No. Composition Thickness Density


Specimen

g/cm³

The information depth of a certain X-ray line is defined as the the thickness of the top layer from which comes

%

of the fluorescence.

What is the Information Depth?

Information depth is the thickness of material beneath the sample surface from which the measured fluorescence signal originates in an analysis. It is defined more precisely as the thickness of the top layer from which a significant proportion (often 90%, 95%, or 99%) of the detected fluorescence originates.

The size of the information depth depends on the attenuation of both the excitation and fluorescence radiation. It is therefore influenced not only by the excitation conditions but also by the properties of the material being analysed (the sample/matrix) and the fluorescence energy of the corresponding X-ray line.

Bruker AXS’s Portfolio for X-ray Analysis

Bruker AXS offers a comprehensive portfolio of XRF instruments, delivering the right solution for every application - from industrial quality control to cutting-edge research.

Our portfolio includes:

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